• Structural investigation of complex surface interfaces by means of X-ray Photoelectron Diffraction
  • Zhan, Rongrong

Subject

  • Ultra-thin films
  • X-ray Photoelectron Diffraction
  • interface
  • SCUOLA DI DOTTORATO DI RICERCA IN FISICA
  • FIS/03 FISICA DELLA MATERIA

Description

  • 2010/2011
  • The goal of this dissertation is to explain how the X-ray photoelectron diffraction technique can be successfully employed in the structural investigation of complex surface interfaces of ultra-thin films. Local geometrical analysis, combined with other techniques that gain additional electronic and surface morphological information to the system investigated, shed light on those extremely complicated surface atomic systems. These studies are aimed to contribute to the many interesting applications in fields like nano-electronics, surface coating and magnetic storage devices.
  • XXIV Ciclo
  • 1982

Date

  • 2012-07-24T08:58:36Z
  • 2012-07-24T08:58:36Z
  • 2012-03-28

Type

  • Doctoral Thesis

Format

  • application/pdf

Identifier

http://hdl.handle.net/10077/7447

urn:nbn:it:units-9151